Jon E Martens

US Patent:

6650123, Nov 18, 2003

Filed:

Jan 15, 2002

Appl. No.:

10/050305

Inventors:

Jon S. Martens - San Jose CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R 2728

US Classification:

324601, 324638

Abstract:

Methods are provided for characterizing N interface devices (e. g. , adapters or test fixture arms) using a vector network analyzer (VNA). These N interface devices are useful for connecting an N-port device under test (DUT) to the VNA. A first step of includes performing an N-port calibration at each of N outer reference planes. A second step includes performing an N-port calibration at each of N inner reference planes. A set of scattering-parameters (S-parameters) is then determined for each of the N interface devices based on results of the calibrations performed at the first step and results of the calibrations performed at the second step. Each set of S-parameters characterizes a respective one of the N interface devices.

US Patent:

6665628, Dec 16, 2003

Filed:

Jan 15, 2002

Appl. No.:

10/050283

Inventors:

Jon S. Martens - San Jose CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R 2728

US Classification:

702117, 702 85, 324 731, 324601, 324637, 324638, 714733, 714734

Abstract:

Methods are provided for virtually embedding and/or de-embedding balanced four-port networks into/from a device under test (DUT). For the methods, a set of scattering-parameters is acquired for the DUT. Additionally, a respective set of scatter-parameters is acquired for each of the balanced four-port networks to be embedded and/or de-embedded. A transfer-matrix is generating for the DUT based on its scattering parameters. Further, a respective transfer-matrix is generated for each of the networks to be embedded/de-embedded based on its respective set of scattering-parameters. The transfer-matrix for the DUT is then multiplied with the one or more transfer-matrices associated with the balanced four-port networks to be embedded and/or by an inverse of the transfer-matrices associated with the balanced four-port networks to be de-embedded. A composite transfer-matrix is thereby produced. Finally, a set of composite scattering-parameters is then generated based on the composite transfer-matrix.

US Patent:

6766262, Jul 20, 2004

Filed:

May 29, 2002

Appl. No.:

10/157546

Inventors:

Jon S. Martens - San Jose CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

H04B 110

US Classification:

702 69, 702191, 455423

Abstract:

Methods for determining a corrected intermodulation distortion (IMD) product measurement for a device under test (DUT) are provided. A ratioed receiver IMD product is measured, where the receiver IMD product results from non-linearities in a receiver. Next, a ratioed composite IMD product is measured, where the composite IMD product results from non-linearities in both the receiver and the DUT. The corrected DUT IMD product (DUTP) can then be determined by subtracting the ratioed receiver IMD product from the ratioed composite IMD product to remove the effects of IMD due to the receiver.

US Patent:

6832170, Dec 14, 2004

Filed:

May 2, 2002

Appl. No.:

10/137694

Inventors:

Jon S. Martens - San Jose CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G06F 1900

US Classification:

702 65, 324 7619

Abstract:

Methods are provided for embedding and/or de-embedding a network having an even number of ports into a device under test (DUT) having an odd number of ports. For example, a four-port network can be embedded/de-embedded into/from a three-port device under test (DUT). This is accomplished by embedding a virtual circulator into the three-port DUT to thereby generate an artificial four-port device. The four-port network is then embedded/de-embedded into/from the artificial four-port device to thereby generate a composite four-port device. The virtual circulator is then de-embedded from the composite four-port device to thereby generate a composite three-port device that is equivalent to the four-port network embedded/de-embedded into/from the three-port DUT.

US Patent:

6882160, Apr 19, 2005

Filed:

Nov 5, 2003

Appl. No.:

10/702028

Inventors:

Jon S. Martens - San Jose CA, US
David V. Judge - Temple NH, US
Jimmy A. Bigelow - Castroville CA, US

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R015/12

US Classification:

324601, 324 731, 702 85, 702106

Abstract:

Techniques are provided for performing full N-port calibrations in an environment in which a test set is used to connect an N-port DUT to an M-port VNA, where N>M. Techniques for incorporating port impedances as part of a calibration sequence are provided. Also provided are techniques for using sequential characterization and de-embedding to generate virtual calibrations that are then used in a renormalization process.

US Patent:

6928373, Aug 9, 2005

Filed:

Aug 15, 2003

Appl. No.:

10/641700

Inventors:

Jon S. Martens - San Jose CA, US
Rena Ho - San Jose CA, US
Jamie Tu - San Jose CA, US

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G06F019/00
G01R035/00

US Classification:

702 65, 324601, 455 6715, 702 85

Abstract:

Methods, systems and computer program products for efficiently characterizing devices under test (DUTs) using a vector network analyzer (VNA) are provided. A N-port DUT can be divided as appropriate into multiple sub-devices, or multiple separate devices can be present. A parent calibration is performed. The VNA is then used to determine the S-parameters of interest for each sub-device or separate device, preferably without measuring S-parameters that are not of interest. This can include measuring S-parameters and removing corresponding error coefficients determined during the parent calibration.

US Patent:

6943563, Sep 13, 2005

Filed:

May 2, 2002

Appl. No.:

10/138989

Inventors:

Jon S. Martens - San Jose CA, US

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R027/28
G01R035/00

US Classification:

324638, 324601

Abstract:

An S-parameter measurement technique allows measurement of devices under test (DUTs), such as power amplifiers, which require a modulated power tone drive signal for proper biasing, in combination with a probe tone test signal, wherein both the modulated and probe tone signals operate in the same frequency range. The technique uses a stochastic drive signal, such as a CDMA or WCDMA modulated signal in combination with a low power probe tone signal. A receiver in a VNA having a significantly narrower bandwidth than the modulated signal bandwidth enables separation of the modulated and probe tone signals. VNA calibration further improves the measurement accuracy. For modulated signals with a significant power level in the frequency range of the probe tone signal, ensemble averaging of the composite probe tone and power tone signals is used to enable separation of the probe tone signal for measurement.

US Patent:

7068046, Jun 27, 2006

Filed:

Nov 18, 2004

Appl. No.:

10/992295

Inventors:

Jon Martens - San Jose CA, US
David Judge - Peterborough NH, US
Jimmy Bigelow - Castroville CA, US

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R 35/00
G01R 27/04

US Classification:

324601, 324638

Abstract:

Embodiments of the present invention are directed towards systems, methods, and computer readable media for performing multiport vector network analysis. Embodiments of the present invention relate to a multiport network analysis that is derived from a family of two port calibration techniques including Thru/Reflect/Line (TRL), Thru/Reflect/Match (TRM), Line/Reflect/Line (LRL), Line/Reflect/Match (LRM) and several others. An improved calibration method enables the use of a simplified switch matrix to perform accurate vector network analysis in communications and networking systems. After determining some characteristics through conventional methods, a two tier load match correction is performed on the results. The improved correction mechanism enables the system to perform comparably to systems with more complicated switch matrices.