Alex C Choi

US Patent:

8589110, Nov 19, 2013

Filed:

Mar 3, 2009

Appl. No.:

12/380663

Inventors:

Guang Liu - Lake Zurich IL, US
Alex Kurnia Choi - Lake Zurich IL, US

Assignee:

Synergistic Technologies Solutions, Inc. - Buffalo Grove IL

International Classification:

G01R 31/40
G01R 31/42

US Classification:

702118, 32476401, 702117, 702121

Abstract:

A cost-effective system architecture and apparatus for programmable automatic power supply testing. The system utilizes board level interface between various system testing modules and an Automatic Test Controller (ATC). The ATC receives coded test requests from the software on an industrial PC and control the various testing modules inside ATC to execute the tests. Test results were sent back to the PC and saved in a result file. A single industrial PC can control two or more ATC's and test two or more power supply units simultaneously. The ATC based test system is lower cost than the conventional Automatic Test Equipment which uses device level interface and standardized test devices.