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Bennett A Joiner

Deceased

from San Angelo, TX

Also known as:
  • Bennett Dr Joiner
  • Bennett Sanangelo
  • Mdr Joiner Bennett
  • Joiner Anderson Bennett
Phone and address:
2302 Douglas Dr, San Angelo, TX 76904

Bennett Joiner Phones & Addresses

  • 2302 Douglas Dr, San Angelo, TX 76904
  • 12219 Cabana Ln, Austin, TX 78727

Work

  • Company:
    Austin community college
    2012 to 2013
  • Position:
    Photography student

Education

  • Degree:
    Doctorates, Doctor of Philosophy
  • School / High School:
    The University of Texas at Austin
    1970 to 1975
  • Specialities:
    Physics

Skills

Semiconductor Packaging • Characterization • Electronics Packaging • Design of Experiments • Engineering Management • Thermal Analysis

Industries

Semiconductors

Us Patents

  • Low Profile Semiconductor Device Having Improved Heat Dissipation

    view source
  • US Patent:
    6847102, Jan 25, 2005
  • Filed:
    Nov 8, 2002
  • Appl. No.:
    10/290959
  • Inventors:
    Mark A. Gerber - Austin TX, US
    Bennett A. Joiner - Austin TX, US
    Jose Antonio Montes De Oca - New Braunfels TX, US
    Trent A. Thompson - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    H01L 23495
  • US Classification:
    257668, 257687
  • Abstract:
    A package substrate () has a first surface, a second surface opposite a first surface, and a cavity () formed in the first surface that extends into the package substrate. The cavity has a cavity wall substantially perpendicular to the first and second surfaces. An integrated circuit die () is placed in the cavity, and a conductive material () is placed in the cavity to thermally couple an outer wall of the integrated circuit to the cavity wall. The conductive material improves the heat dissipation path between the integrated circuit die and the package substrate. The cavity may extend through the package substrate to the second surface such that the second surface of the package substrate is substantially coplanar to a surface of the integrated circuit die. An encapsulation layer () may be formed over the conductive material, integrated circuit die, and at least a portion of the first surface of the package substrate.
  • Electromagnetic Noise Shielding In Semiconductor Packages Using Caged Interconnect Structures

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  • US Patent:
    6933599, Aug 23, 2005
  • Filed:
    Oct 27, 2003
  • Appl. No.:
    10/694146
  • Inventors:
    Bennett A. Joiner - Austin TX, US
    Yaping Zhou - Austin TX, US
    Ben W. Herberg - Pflugerville TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    H01L023/48
  • US Classification:
    257690, 257691, 257693, 257773, 257659, 257786, 257784, 257777, 257775, 257776, 257723, 257676, 257774, 257737, 257734, 257728, 439108
  • Abstract:
    A semiconductor device has a die () overlying and electrically connected to a support structure (), such as a substrate or a lead frame, via a plurality of interconnects. Aggressor interconnects () are noise sources to victim interconnects () carrying sensitive signals. An arrangement of shield interconnects () surround the victim interconnect () in a cage-like structure to significantly block noise from the aggressor interconnect. In one form the shield interconnects are ground or power supply and the victim interconnect may be, for example, a clock signal or an RF signal. The number of shield interconnects and the number of protected victim interconnects varies depending upon design requirements. Either wire bonding or other interconnect technology (e. g. bump) is applicable.
  • Thermally Enhanced Molded Package For Semiconductors

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  • US Patent:
    7361985, Apr 22, 2008
  • Filed:
    Oct 27, 2004
  • Appl. No.:
    10/974658
  • Inventors:
    Yuan Yuan - Austin TX, US
    Bennett Joiner - Austin TX, US
    Chuchung (Stephen) Lee - Round Rock TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    H01L 23/34
  • US Classification:
    257713, 257E23083
  • Abstract:
    An integrated circuit package () is provided which comprises a substrate (), an integrated circuit () mounted on the substrate, and a compressive, thermally conductive interposer () mounted on the integrated circuit.
  • Low Profile Semiconductor Device With Like-Sized Chip And Mounting Substrate

    view source
  • US Patent:
    57342016, Mar 31, 1998
  • Filed:
    Oct 21, 1994
  • Appl. No.:
    8/328978
  • Inventors:
    Frank Djennas - Austin TX
    Wilhelm Sterlin - Austin TX
    Bennett A. Joiner - Austin TX
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01L 2348
  • US Classification:
    257783
  • Abstract:
    A low profile semiconductor device (24) is manufactured by mounting a semiconductor die (26) onto a substrate (28) using an interposer (30). The interposer couples an active surface (32) of the die (26) to conductive traces (33) on the top surface of the substrate. The interposer is directionally conductive so that electrical conductivity is limited to the z-direction through thickness of the interposer. The interposer both affixes the die to the substrate and provides the first level of interconnects for the device. The inactive surface (36) of the die can be exposed for efficient thermal dissipation. An optional heat spreader (50) may be added for increased thermal management. The device may be overmolded, glob-topped, capped, or unencapsulated. Separate die-attach and wire bonding processes are eliminated. A second level of interconnects are provided by either solder balls (38), solder columns (44), or pins (64).
  • Method For Making A Thermally Enhanced Semiconductor Device By Holding A Leadframe Against A Heatsink Through Vacuum Suction In A Molding Operation

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  • US Patent:
    51478218, Sep 15, 1992
  • Filed:
    Oct 31, 1991
  • Appl. No.:
    7/786205
  • Inventors:
    Michael B. McShane - Austin TX
    James J. Casto - Austin TX
    Bennett A. Joiner - Austin TX
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01L 2156
    H01L 2158
    H01L 2160
    H01L 21603
  • US Classification:
    437212
  • Abstract:
    A method for making a semiconductor device having a heat sink is provided in which an opening through the heat sink enables a vacuum source to be applied to a semiconductor die mounting surface. In one form, a semiconductor die is attached to a mounting surface of a leadframe. The leadframe also has a plurality of leads which are electrically coupled to the semiconductor die. The semiconductor die and portions of the leads are encapsulated in a package body. Also incorporated into the package body is a heat sink. The heat sink has an opening which extends through the heat sink and exposes a portion of the mounting surface of the leadframe. The opening is used to apply a vacuum to the mounting surface during the formation of the package body so that the mounting surface and heat sink are held in close proximity. The closeness provides a good thermal conduction path from the semiconductor die to the ambient, thereby enhancing the thermal dissipation properties of the device.
  • Method Of Fabricating A Thermally Enhanced Lead Frame

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  • US Patent:
    56839448, Nov 4, 1997
  • Filed:
    Sep 1, 1995
  • Appl. No.:
    8/522889
  • Inventors:
    Bennett A. Joiner - Austin TX
    Greg L. Ridsdale - Austin TX
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01L 2158
    H01L 2160
  • US Classification:
    437220
  • Abstract:
    The device has a semiconductor die (18) mounted upon a downset X-shape die support (12) of a lead frame (10, 40). The lead frame also has tie bars (16) which are connected to the X-shape die support. Attached to the tie bars are thermal bars (14, 14') which are located between the semiconductor die and inner portion of the leads (20). The inner portion of the leads, the tie bars, and the thermal bars are offset from the plane occupied by the X-shape die support. The thermal bars aid in dissipating the heat from the die into the nearby lead tips so that the heat can be conducted out of the package body (30) through the thermally conductive lead frame. The semiconductor die is wire bonded to the inner portion of the leads. A package body (30) protects the die, the wire bonds (26), the thermal bars, and the inner portion of the leads.
  • Thermally Enhanced Semiconductor Device Utilizing A Vacuum To Ultimately Enhance Thermal Dissipation

    view source
  • US Patent:
    51052598, Apr 14, 1992
  • Filed:
    Sep 28, 1990
  • Appl. No.:
    7/589465
  • Inventors:
    Michael B. McShane - Austin TX
    James J. Casto - Austin TX
    Bennett A. Joiner - Austin TX
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01L 2328
  • US Classification:
    357 72
  • Abstract:
    A semiconductor device having a heat sink is provided in which an opening through the heat sink enables a vacuum source to be applied to a semiconductor die mounted surface. In one form, a semiconductor die is attached to a mounting surface of a leadframe. The leadframe also has a plurality of leads which are electrically coupled to the semiconductor die. The semiconductor die and portions of the leads encapsulated in a package body. Also incorporated in the package body is a heat sink. The heat sink has an opening which extends through the heat sink and exposes a portion of the mounting surface of the leadframe. The opening is used to apply a vacuum to the mounting surface during the formation of the package body so that the mounting surface and heat sink are held in close proximity. The closeness provides a good thermal conduction path from the semiconductor die to the ambient, thereby enhancing the thermal dissipation properties of the device.
  • Drop-In Heat Sink Package With Window Frame Flag

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  • US Patent:
    54830982, Jan 9, 1996
  • Filed:
    Oct 18, 1994
  • Appl. No.:
    8/326160
  • Inventors:
    Bennett A. Joiner - Austin TX
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01L 23495
  • US Classification:
    257676
  • Abstract:
    A molded semiconductor device (24) having greater resistance to package cracking during board mounting in addition to increased thermal performance is provided wherein the device has a reduced semiconductor die to flag interface and a drop-in heat sink. The semiconductor die (12) is mounted on a leadframe (16) having a flag (15) with an opening to expose a substantial portion of the inactive surface (14) of the die (12). Decreasing the interfacial contact area between the die (12) and the flag (15) reduces the risk of package cracking during board mounting by limiting the area where delamination typically occurs. An encapsulant (22) forms a package body which encompasses an opening (23) to expose a substantial portion of the inactive surface (14) of the semiconductor die (12). A heat sink (26) is inserted into the opening (23), directly coupling the heat sink (26) to the die (12), after the semiconductor package is mounted onto a printed circuit board.
Name / Title
Company / Classification
Phones & Addresses
Bennett Joiner
Manager
Motorola Inc
Computer Peripheral Equipment
7700 W Parmer Ln # Tx32/Pl02, Austin, TX 78729

Resumes

Bennett Joiner Photo 1

Photography Student

view source
Location:
Austin, TX
Industry:
Semiconductors
Work:
Austin Community College 2012 - 2013
Photography Student

Freescale Semiconductor Feb 2005 - Jan 2012
Thermal Analyst

Motorola 1990 - 2005
Thermal Analyst
Education:
The University of Texas at Austin 1970 - 1975
Doctorates, Doctor of Philosophy, Physics
Skills:
Semiconductor Packaging
Characterization
Electronics Packaging
Design of Experiments
Engineering Management
Thermal Analysis

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  • Category:
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  • Uploaded:
    01 Jan, 2009
  • Duration:
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Southeast Inspirational Choir "Glory" RIP Shi...

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  • Category:
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  • Uploaded:
    04 Nov, 2008
  • Duration:
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Southeast Inspirational Choir: Just Like Jesu...

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What's My Line? Joey Heatherton

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  • Category:
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  • Uploaded:
    30 Nov, 2010
  • Duration:
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  • Category:
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