Carlos F Guerra

Address:

14728 SW 112 Ter, Miami, FL 33196

VIN:

2HGFG21527H704963

Make:

HONDA

Model:

CIVIC

Year:

2007

US Patent:

6404841, Jun 11, 2002

Filed:

Dec 29, 1999

Appl. No.:

09/473676

Inventors:

Carl Pforr - Milwaukee WI
Hui David He - Waukesha WI
Sholom M. Ackelsberg - Ridgewood NJ
Xiangfeng Ni - Milwaukee WI
Chalapathy V. Dhanwada - Arlington Heights IL
Carlos F. Guerra - Lake Mills WI
Holly A. McDaniel - New Berlin WI
Gary R. Strong - Waukesha WI

Assignee:

GE Medical Systems Global Technology Company, LLC - Waukesha WI

International Classification:

A61B 600

US Classification:

378 4, 378 19, 378 12, 378 15

Abstract:

Scalable multislice systems which, in one embodiment, includes a scalable multislice detector, a scalable data acquisition system (SDAS), scalable scan management, control, and image reconstruction processes, and a user interface, are described. More specifically, the user interface is implemented in a host computer for defining the configuration of the imaging system. Particularly, after selection of each scan parameter, the user interface displays the available scan parameter values for the remaining parameters so that the scan objectives are met. More specifically, after selection of each scan parameter, the user interface updates the remaining scan parameters, including prospective and retrospective image thicknesses.

US Patent:

6285741, Sep 4, 2001

Filed:

Aug 25, 1998

Appl. No.:

9/140105

Inventors:

Sholom M. Ackelsberg - Brookfield WI
Gary R. Strong - Waukesha WI
Holly A. McDaniel - New Berlin WI
Carlos F. Guerra - Lake Mills WI
Hui Hu - Waukesha WI
Hui David He - Waukesha WI
Robert Senzig - Germantown WI

Assignee:

General Electric Company - Schenectady NY

International Classification:

A61B 600

US Classification:

378110

Abstract:

The present invention, in one form, is a system which, in one embodiment, adjusts the x-ray source current to reduce image noise to better accommodate different scanning parameters. Specifically, in one embodiment, the x-ray source current is adjusted as a function of image slice thickness, scan rotation time, collimation mode, table speed, scan mode, and filtration mode. Particularly, a function is stored in a CT system computer to determine an x-ray source current adjustment factor so that the appropriate x-ray source current is supplied to the x-ray source for the determined parameters. After adjusting the x-ray source current, an object is scanned.