Curt Alfred Preissner from 1240 W Monroe St UNIT 8, Chicago, IL 60607, age 50, Phone: 3122267826

Resumes

Mechanical Engineer

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Location:

Chicago, IL

Industry:

Research

Work:

University of Illinois at Chicago May 2010 - Dec 2014
Adjunct Assistant Professor
The Dissertation Coach May 2010 - Dec 2014
Dissertation Coach
University of Illinois at Chicago Aug 2009 - May 2010
Lecturer
Asme (The American Society of Mechanical Engineers) 2003 - 2009
Program Committee
Argonne National Laboratory 2003 - 2009
Mechanical Engineer

Education:

University of Illinois at Chicago 2001 - 2009
Doctorates, Doctor of Philosophy, Mechanical Engineering University of Illinois at Chicago 1996 - 2001
Master of Science, Masters, Mechanical Engineering University of Illinois at Chicago 1991 - 1996
Bachelors, Bachelor of Science, Mechanical Engineering

Skills:

Modeling
Finite Element Analysis
Numerical Analysis
Labview
Simulations
Matlab
Experimentation
Mathematical Modeling
Ansys
Fortran
Simulink
Instrumentation
Pro Engineer
Engineering
Solidworks
R&D
Physics
Research
Mechanical Engineering

Us Patents

Optomechanical Structure For A Multifunctional Hard X-Ray Nanoprobe Instrument
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US Patent:

7331714, Feb 19, 2008
Filed:

Sep 29, 2005
Appl. No.:

11/238196
Inventors:

Deming Shu - Darien IL, US
Jorg M. Maser - Oak Park IL, US
Barry Lai - Woodridge IL, US
Franz Stefan Vogt - Plainfield IL, US
Martin V. Holt - Chicago IL, US
Curt A. Preissner - Rosemont IL, US
Robert P. Winarski - Lockport IL, US
Gregory B. Stephenson - Lisle IL, US
Assignee:

UChicago Argonne, LLC - Chicago IL
International Classification:

H05G 1/00
G21K 1/06
G01N 23/083
G01N 23/20
G01N 23/223
US Classification:

378208, 378 44, 378 46, 378 51, 378 71, 378 79, 378 80, 378 84, 378189
Abstract:

A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging. The full field transmission mode allows two-dimensional (2-D) imaging and tomography. The nanoprobe instrument includes zone plate optics for focusing and imaging. The nanoprobe instrument includes a stage group for positioning the zone plate optics. The nanoprobe instrument includes a specimen stage group for positioning the specimen. An enhanced laser Doppler displacement meter (LDDM) system provides two-dimensional differential displacement measurement in a range of nanometer resolution between the zone-plate optics and the sample holder. A digital signal processor (DSP) implements a real-time closed-loop feedback technique for providing differential vibration control between the zone-plate optics and the sample holder.

Robot-Based Automation System For Cryogenic Crystal Sample Mounting
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US Patent:

20040187515, Sep 30, 2004
Filed:

Mar 24, 2004
Appl. No.:

10/807599
Inventors:

Deming Shu - Darien IL, US
Andrzej Joachimiak - Bolingbrook IL, US
Curt Preissner - Rosemont IL, US
Daniel Nocher - Elwood IL, US
Yufeng Han - Chicago IL, US
Juan Barraza - Los Alamos NM, US
Peter Lee - Wheaton IL, US
Zhonghou Cai - Naperville IL, US
Stephan Ginell - Naperville IL, US
Randy Alkire - Romeoville IL, US
Robert Schuessler - Downers Grove IL, US
International Classification:

B25B001/00
F25D025/00
B66C001/42
B66C001/00
F25B021/00
F17C013/00
US Classification:

062/378000, 294/119100, 294/106000
Abstract:

A method and robot-based automation system are provided for cryogenic crystal sample mounting, for example, for use for cryogenic crystal sample mounting in the x-ray crystallography station at an x-ray source. The system includes a robot arm carrying a handset. The handset includes a pair of elongated fingers for sample mounting, and each finger carrying a set of strain gauge arrays for providing force sensing. A slim finger design allows a sample mounting process with no interference with the beam stop, cryostreem and x-ray detectors. The handset can detect the contact force intensity and direction; provide a precise gripping action; and feel the results of the gripping. The finger design incorporates a mechanism to maintain the sample temperature well below the cryogenic safety margin for the crystal viability. A Dewar container is provided with an ice control system and liquid nitrogen flow control. A triangular sample magazine maximizes the Dewar space usage. A miniature kinematical mounting sample holder provides near micron positioning repeatability. These capabilities make the robot-arm more powerful, flexible, and reliable.

Mechanical Design Of Deformation Compensated Flexural Pivots Structured For Linear Nanopositioning Stages
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US Patent:

20140055005, Feb 27, 2014
Filed:

Aug 24, 2012
Appl. No.:

13/593799
Inventors:

Deming Shu - Darian IL, US
Steven P. Kearney - Westchester IL, US
Curt A. Preissner - Chicago IL, US
Assignee:

UCHICAGO ARGONNE, LLC - Chicago IL
International Classification:

H02N 2/04
US Classification:

310328
Abstract:

A method and deformation compensated flexural pivots structured for precision linear nanopositioning stages are provided. A deformation-compensated flexural linear guiding mechanism includes a basic parallel mechanism including a U-shaped member and a pair of parallel bars linked to respective pairs of I-link bars and each of the I-bars coupled by a respective pair of flexural pivots. The basic parallel mechanism includes substantially evenly distributed flexural pivots minimizing center shift dynamic errors.

Simultaneous Topographic And Elemental Chemical And Magnetic Contrast In Scanning Tunneling Microscopy
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US Patent:

20140259235, Sep 11, 2014
Filed:

Mar 8, 2013
Appl. No.:

13/791157
Inventors:

- Argonne IL, US
Curt A. Preissner - Chicago IL, US
Kangkang Wang - Fremont CA, US
Daniel Rosenmann - Naperville IL, US
Assignee:

UCHICAGO ARGONNE, LLC - Argonne IL
International Classification:

G01Q 60/16
US Classification:

850 29
Abstract:

A method and system for performing simultaneous topographic and elemental chemical and magnetic contrast analysis in a scanning, tunneling microscope. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.