Earl C Labatt

US Patent:

20080016412, Jan 17, 2008

Filed:

Aug 1, 2007

Appl. No.:

11/832319

Inventors:

David WHITE - Merrimack NH, US
John McGEE - Christiansburg VA, US
Steven BARON - Nashua NH, US
Edward MACOMBER - Westford MA, US
Earl LaBATT - Litchfield NH, US

Assignee:

OPNET TECHNOLOGIES, INC. - Bethesda MD

International Classification:

G06F 11/34

US Classification:

714048000, 714E11192

Abstract:

A metric monitoring and analysis system including dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent includes a data adapter collecting metric data in a common format, a threshold generator for determining dynamic metric threshold ranges, an alarm detector generating an indicator when a metric deviates outside a dynamic threshold range or a static threshold, and a deviation tracker generating an alarm severity scores. The service platform includes an alarm analyzer identifying root causes of system alarm conditions by correlation of grouped metrics or forensic analysis of temporally or statistically correlated secondary forensic data or data items from a service model of the system.