Xie Shao - Rolla MO, US Jim D. Meador - Ballwin MO, US Mandar Bhave - Rolla MO, US Vandana Krishnamurthy - Rolla MO, US Kelly A. Nowak - Rolla MO, US Michelle Fowler - Rolla MO, US Shreeram V. Deshpande - Rolla MO, US
Assignee:
Brewer Science Inc. - Rolla MO
International Classification:
G03C001/492
US Classification:
4302711, 430325, 430950, 257437
Abstract:
Anti-reflective compositions and methods of using those compositions to form circuits are provided. The compositions comprise a polymer dissolved or dispersed in a solvent system. In one embodiment, the compositions comprise less than about 0. 3% by weight of a strong acid. In another embodiment, the weight ratio of strong acid to weak acid in the composition is from about 0:100 to about 25:75. Examples of preferred weak acid compounds include phenolic compounds (e. g. , Bisphenol S, Bisphenol A, α-cyano-4-hydroxycinnamic acid), carboxylic acids (e. g. , acetic acid), phosphoric acid, and cyano compounds. The polymer and other ingredients are preferably physically mixed in a solvent system. The resulting compositions are spin bowl compatible (i. e. , they do not crosslink prior to the bake stages of the microlithographic processes or during storage at room temperature).
Thermally Curable Middle Layer Comprising Polyhedral Oligomeric Silsesouioxanes For 193-Nm Trilayer Resist Process
New lithographic compositions (e. g. , for use as middle layers in trilayer processes) are provided. In one embodiment, the compositions comprise an organo-silicon polymer dispersed or dissolved in a solvent system, and preferably a crosslinking agent and a catalyst. In another embodiment, the organo-silicon polymer is replaced with a polyhedral oligomeric silsesquioxane-containing polymer and/or a polyhedral oligomeric silsesquioxane. In either embodiment, the polymer and/or compound should also include —OH groups for proper cross-linking of the composition. When used as middle layers, these compositions can be applied as very thin films with a very thin layer of photoresist being applied to the top of the middle layer. Thus, the underlying bottom anti-reflective coating is still protected even though the overall stack (i. e. , anti-reflective coating plus middle layer plus photoresist) is still thin compared to prior art stacks.
Jim D. Meador - Manchester MO, US Joyce A. Lowes - Gerald MO, US
Assignee:
Brewer Science Inc. - Rolla MO
International Classification:
G03F 7/00 G03F 7/004 G03F 7/028 G03F 7/095
US Classification:
4302701, 4302711, 430913, 430927
Abstract:
Acid-sensitive, developer-soluble bottom anti-reflective coating compositions are provided, along with methods of using such compositions and microelectronic structures formed thereof. The compositions preferably comprise a crosslinkable polymer dissolved or dispersed in a solvent system. The polymer preferably comprises recurring monomeric units having adamantyl groups. The compositions also preferably comprise a crosslinker, such as a vinyl ether crosslinking agent, dispersed or dissolved in the solvent system with the polymer. In some embodiments, the composition can also comprise a photoacid generator (PAG) and/or a quencher. The bottom anti-reflective coating compositions are thermally crosslinkable, but can be decrosslinked in the presence of an acid to be rendered developer soluble.
Novel, developer-soluble anti-reflective coating compositions and methods of using those compositions are provided. The compositions comprise a multi-functional acid reacted with a multi-functional vinyl ether to form a branched polymer or oligomer. In use, the compositions are applied to a substrate and thermally crosslinked. Upon exposure to light and post-exposure baking, the cured polymers/oligomers will decrosslink and depolymerize, rendering the layer soluble in typical photoresist developing solutions (e. g. , alkaline developers).
Dual-Layer Light-Sensitive Developer-Soluble Bottom Anti-Reflective Coatings For 193-Nm Lithography
The present invention provides methods of fabricating microelectronics structures and the resulting structures formed thereby using a dual-layer, light-sensitive, wet-developable bottom anti-reflective coating stack to reduce reflectance from the substrate during exposure. The invention provides dye-filled and dye-attached compositions for use in the anti-reflective coatings. The anti-reflective coatings are thermally crosslinkable and photochemically decrosslinkable. The bottom anti-reflective coating stack has gradient optical properties and develops at the same time as the photoresist. The method and structure are particularly suited to high-NA lithography processes.
Non-Subliming Mid-Uv Dyes And Ultra-Thin Organic Arcs Having Differential Solubility
Jim D. Meador - Ballwin MO Xie Shao - Rolla MO Vandana Krishnamurthy - Rolla MO Earnest C. Murphy - Rolla MO Tony D. Flaim - St. James MO Terry Lowell Brewer - Rolla MO
Assignee:
Brewer Science, Inc. - Rolla MO
International Classification:
C07C25509
US Classification:
558393
Abstract:
Mid-UV dyes enabling ultra thin antireflection coatings for multi-layer i-line photoetching are produced from bichalcones; bis-a-cyanoacrylates/bis-cyanoacrylamides; and 1. 4 divinylbenzenes. The dyes are nonsubliminal and differentially insoluble in standard photoresist solvents.
Tony D. Flaim - St.James MO Jim D. Meador - Ballwin MO Xie Shao - Rolla MO Terry Lowell Brewer - Rolla MO
Assignee:
Brewer Science, Inc. - Rolla MO
International Classification:
C08L 6300 C08L 6120 C08F28310 C08K 504
US Classification:
523436
Abstract:
A thermosetting anti-reflective coating and method for making and using the same is disclosed for a broad range of exposure wavelengths, said coating containing an active curing catalyst, ether or ester linkages derived from epoxy functionality greater than 3. 0, a dye-grafted hydroxyl-functional oligomer, and an alkylated aminoplast crosslinking agent, all present in a low-to-medium alcohol-containing solvent.
Non-Subliming Mid-Uv Dyes And Ultra-Thin Organic Arcs Having Differential Solubility
Jim D. Meador - Ballwin MO Xie Shao - Rolla MO Vandana Krishnamurthy - Rolla MO Earnest C. Murphy - Rolla MO Tony D. Flaim - St. James MO Terry Lowell Brewer - Rolla MO
Assignee:
Brewer Science, Inc. - Rolla MO
International Classification:
C07C25500
US Classification:
558393
Abstract:
Mid-UV dyes enabling ultra thin antireflection coatings for multi-layer i-line photoetching are produced from bichalcones; bis-a-cyanoacrylates/bis-cyanoacrylamides; and 1. 4 divinylbenzenes. The dyes are nonsubliminal and differentially insoluble in standard photoresist solvents.