Shamouil Shamouilian - San Jose CA Anada H. Kumar - Milpitas CA Donald J. Olgado - Palo Alto CA Joseph J. Stevens - San Jose CA Ricardo Leon - Palo Alto CA Jon Clinton - San Jose CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
B23H 704
US Classification:
2042281, 2042298, 2042302, 2042308, 2042861
Abstract:
The present invention relates to a device that supplies electricity to a substrate. In one embodiment, the device includes multiple contacts, a current sensor, and a current regulator. The current sensor is attached to each of the plurality of contacts to sense their electric current. A current regulator controls current applied to each of the multiple contacts in response to the current sensor. In another embodiment, a compliant ridge is formed about the periphery of each contact to seal the contact from undesired chemicals.
Method And Apparatus For Supplying Electricity Uniformly To A Workpiece
Shamouil Shamouilian - San Jose CA, US Anada Kumar - Milpitas CA, US Donald Olgado - Palo Alto CA, US Joseph Stevens - San Jose CA, US Ricardo Leon - Palo Alto CA, US Jon Clinton - San Jose CA, US
Assignee:
Applied Materials, Inc.
International Classification:
B23H003/02
US Classification:
204/228100
Abstract:
The present invention relates to a device that supplies electricity to a substrate. In one embodiment, the device includes multiple contacts, a current sensor, and a current regulator. The current sensor is attached to each of the plurality of contacts to sense their electric current. A current regulator controls current applied to each of the multiple contacts in response to the current sensor. In another embodiment, a compliant ridge is formed about the periphery of each contact to seal the contact from undesired chemicals.
Maocheng Li - Fremont CA, US John Holland - San Jose CA, US Patrick Leahey - San Jose CA, US Xueyu Qian - San Jose CA, US Michael Barnes - San Ramon CA, US Jon Clinton - Irvine CA, US You Wang - Cupertino CA, US Nianci Han - San Jose CA, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
B31B 1/60 C23F 1/00 C23C 16/00
US Classification:
156345480, 11872300R, 156060000
Abstract:
A bonded multi-layer RF window may include an external layer of dielectric material having desired thermal properties, an internal layer of dielectric material exposed to plasma inside a reaction chamber, and an intermediate layer of bonding material between the external layer and the internal layer. Heat produced by the chemical reaction inside the chamber and by the transmission of RF energy through the window may be conducted from the internal layer to the external layer, which may be cooled during a semiconductor wafer manufacturing process. A bonded multi-layer RF window may include cooling conduits for circulating coolant to facilitate cooling of the internal layer; additionally or alternatively, gas distribution conduits and gas injection apertures may be included for delivering one or more process gases into a reaction chamber. A system including a plasma reaction chamber may employ the inventive bonded multi-layer RF window.
Multi-Electrode Electrostatic Chuck Having Fuses In Hollow Cavities
Jon Clinton - San Jose CA Mark Contreras - San Jose CA Anand H. Kumar - Milpitas CA Shamouil Shamouilian - San Jose CA You Wang - Sunnyvale CA Surinder Bedi - Fremont CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H02N 1300
US Classification:
361234
Abstract:
A failure resistant electrostatic chuck 20 for holding a substrate 35 during processing of the substrate 35 comprises one or more electrodes 25 covered by an insulator 30, the electrodes 25 capable of electrostatically holding a substrate 35 when a voltage is applied thereto. An electrical power bus 40 comprises one or more output terminals 45 that conduct voltage to the electrodes 25. The fuses 50 are positioned in hollow cavities 55 in the insulator 30, and electrically connect the electrodes 25 in series to the output terminals 45 of the power bus 40. Each fuse 50 can electrically disconnect an electrode 25 from an output terminal 45 when the insulator 30 covering the electrode 25 punctures and exposes the electrode 25 to a plasma process environment thereby causing a plasma current discharge to flow through the fuse 50.
Arik Donde - Cupertino CA Hyman J. Levinstein - Berkeley Heights NJ Robert W. Wu - Pleasanton CA Andreas Hegedus - San Francisco CA Edwin C. Weldon - Los Gatos CA Shamouil Shamouilian - San Jose CA Jon T. Clinton - San Jose CA Surinder S. Bedi - Fremont CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H02N 1300
US Classification:
361234
Abstract:
A puncture resistant electrostatic chuck (20) is described. The chuck (20) comprises at least one electrode (25); and a composite insulator (30) covering the electrode. The composite insulator comprises a matrix material having a conformal holding surface (50) capable of conforming to the substrate (35) under application of an electrostatic force generated by the electrode to reduce leakage of heat transfer fluid held between the substrate and the holding surface. A hard puncture resistant layer, such a layer of fibers or an aromatic polyamide layer, is positioned below the holding surface (50) and is sufficiently hard to increase the puncture resistance of the composite insulator.
Electrostatic Chuck With Improved Temperature Control And Puncture Resistance
Shamouil Shamouilian - San Jose CA Arnold Kholodenko - San Francisco CA Semyon Kats - San Francisco CA Semyon Sherstinsky - San Francisco CA Jon Clinton - San Jose CA Surinder Bedi - Fremont CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H01G 2300
US Classification:
361234
Abstract:
Apparatus for supporting a workpiece and method of making same. The apparatus comprises a flex circuit laminated to a contoured support pedestal. The flex circuit includes a reinforced layer to improve puncture resistance of the flex circuit. The top surface of the chuck has a contoured topography that is achieved by machining the upper surface of the pedestal prior to lamination of the flex circuit to the pedestal. The contoured topography improves the flow of backside cooling gas resulting in a more uniform wafer temperature profile.
Polymer Chuck With Heater And Method Of Manufacture
Surinder S. Bedi - Fremont CA Shamouil Shamouilian - San Jose CA Syed H. Askari - Santa Clara CA Arnold Kholodenko - San Francisco CA Jon T. Clinton - San Jose CA Alexander M. Veytser - Mountain View CA You Wang - Cupertino CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H01G 2300
US Classification:
361234
Abstract:
An electrostatic chuck 20 for holding a substrate 25 in a process chamber 30 comprises an electrostatic member 115 comprising a polymer 120 covering an electrode 125, the polymer 120 having a receiving surface 135 for receiving the substrate 25. A heater 130 abutting the polymer 120 is provided to heat the substrate 25 during processing of the substrate 25. The heater 130 has a resistance that is sufficiently low to heat the substrate 25 without causing excessive thermal degradation of the polymer 120.
Arik Donde - Austin TX Hyman J. Levinstein - Berkeley Heights NJ Robert W. Wu - Pleasanton CA Andreas Hegedus - San Francisco CA Edwin C. Weldon - Los Gatos CA Shamouil Shamouilian - San Jose CA Jon T. Clinton - San Jose CA Surinder S. Bedi - Fremont CA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
H02N 1300
US Classification:
361234
Abstract:
A puncture resistant electrostatic chuck (20) is described. The chuck (20) comprises at least one electrode (25); and a composite insulator (30) covering the electrode. The composite insulator comprises a matrix material having a conformal holding surface (50) capable of conforming to the substrate (35) under application of an electrostatic force generated by the electrode to reduce leakage of heat transfer fluid held between the substrate and the holding surface. A hard puncture resistant layer, such a layer of fibers or an aromatic polyamide layer, is positioned below the holding surface (50) and is sufficiently hard to increase the puncture resistance of the composite insulator.
John Clinton Porter, born in Leon, Iowa (April 4, c. 1872 May 27, 1959) was a U.S. political figure. He served as the 33rd Mayor of Los Angeles between 1929 and
John Clinton (1963-1967), Brian Luster (1969-1973), Jeff Swing (1978-1981), Angela Curristan (1971-1975), Tammy Rockwell (1978-1982), Dave N (1977-1981)