Matthew Miczek

US Patent:

20110148448, Jun 23, 2011

Filed:

Dec 8, 2010

Appl. No.:

12/963322

Inventors:

Gary F. St. Onge - Ballston Lake NY, US
Scott F. Gold - Albany NY, US
Matthew T. Miczek - Saratoga Springs NY, US

International Classification:

G01R 1/067
G06F 19/00

US Classification:

32475501, 702 85

Abstract:

A test fixture for testing loaded printed circuit boards having a plurality of test points having a probe plate including an array of widely spaced high force spring test probes in compliant contact with solid translator pins located in a translator fixture removably positioned over the probe plate. The test fixture includes optimization software wherein translation of the test signals are optimized by providing the shortest interconnect distance in the x-y plane between the test points on the printed circuit board and the test probes in the probe plate. The fixture further includes an unpowered opens device for testing components on the loaded printed circuit board.