Michael B Iaquinta

US Patent:

7116750, Oct 3, 2006

Filed:

Dec 2, 2004

Appl. No.:

11/004277

Inventors:

Michael Iaquinta - Westerville OH, US
David Pond - Dublin OH, US
John W. Pettit - Derwood MD, US

Assignee:

Automation and Control Technology, Inc. - Columbus OH

International Classification:

G01N 23/06

US Classification:

378 53, 378 51

Abstract:

A method for detecting and measuring regions of a secondary material deposited onto a moving substrate. The method employs an x-ray source for directing an x-ray beam at the moving substrate, and an x-ray detector to detect an amount of x-ray energy transmitted by the moving sheet of material. Areas of bare substrate will allow for different amounts of x-ray transmission than areas of the substrate containing the secondary material. These differences in transmission and/or absorption can be used to detect the location of a region of secondary material and to determine if it falls within an acceptable range. According to one particular embodiment of the present invention, the method can be used to analyze burn characteristic modifying bands of a secondary material intermittently and repeatedly deposited to a moving web of smoking article paper.

Address:

6067 Harbour Town Cir, Westerville, OH 43082

VIN:

2GCEK133371587241

Make:

CHEVROLET

Model:

SILVERADO 1500

Year:

2007