Shirish N Kher

US Patent:

20060069581, Mar 30, 2006

Filed:

Sep 30, 2004

Appl. No.:

10/954678

Inventors:

Ying-Che Chien - Holmdel NJ, US
Niren Choudhury - Bridgewater NJ, US
Paul Franklin - Colts Neck NJ, US
Shirish Kher - Plainsboro NJ, US
Paul Remick - Hazlet NJ, US
Philip Scarff - Winchester MA, US
Hongzhou Wang - Bridgewater NJ, US

International Classification:

G06Q 99/00

US Classification:

705001000

Abstract:

Method and apparatus for calculating warranty cost includes determining values for a plurality of parameters that characterize a corresponding plurality of physical conditions of a product that is returned under warranty, determining values for a plurality of variables that characterize a customer profile for the product and evaluating an expression that calculates warranty cost based on said determined parameter and variable values. The plurality of physical conditions of the product includes the conditions of no-trouble-found (NTF), repaired, junked, and subject to further failure mode analysis (FMA). The plurality of parameters further comprises probabilities and costs that correspond to each of the physical conditions. Evaluating the above expression includes evaluating a first expression that calculates repair, product conformance and Dead-On-Arrival cost and evaluating a second expression that calculates Change Notice cost. Subsequently, the two costs are summed to arrive at the total warranty cost.