Stephen T Gottesman

US Patent:

7541592, Jun 2, 2009

Filed:

Sep 20, 2007

Appl. No.:

11/858312

Inventors:

Stephen R. Gottesman - Baltimore MD, US

Assignee:

Northrop Grumman Systems Corporation - Los Angeles CA

International Classification:

G01T 1/24
G01T 1/161

US Classification:

25037006, 25036306

Abstract:

A combined format gamma-ray detector (D) for measuring impinging gamma-rays () includes an active upper level coded aperture detector plane member () that is suitable for detecting an impinging gamma-ray (). An active lower level gamma ray detector plane member () that is spaced apart from the upper level coded aperture () detects an impinging gamma-ray (). At low gamma-ray energies, the combined format gamma-ray detector device (D) operates as a conventional coded aperture system and at higher gamma-ray energies, the combined format gamma-ray detector device operates as a Compton scattering detector device.