The present invention provides polymers which are substantially or completely free of inorganic contaminants and the use of such polymers as a resin component for photoresist compositions, particularly chemically-amplified positive-acting resists. Polymers of the invention also are suitable for use as a resin component for antireflective coating compositions (ARCs). More particularly, the invention provides methods for reducing such contaminants in polymerization initiators, particularly free radical initiators.
Edward K. Pavelchek - Stow MA, US Timothy G. Adams - Sudbury MA, US Manuel doCanto - Stoughton MA, US Suzanne Coley - Mansfield MA, US George G. Barclay - Jefferson MA, US
Assignee:
Shipley Company, L.L.C. - Marlborough MA
International Classification:
G03F007/00
US Classification:
430 14, 430 9, 430 18, 430290, 430950
Abstract:
The present invention provides new light absorbing compositions suitable for use as antireflective coating compositions (“ARCs”), including for deep UV applications. The antireflective compositions of the invention are particularly useful where a planarizing coating layer is required. ARCs of the invention contain a low molecular weight resin, a plasticizer compound and/or a low Tg resin. The invention also includes methods for applying forming planarizing ARC coating layers.
Coating Compositions For Use With An Overcoated Photoresist
Anthony Zampini - Westborough MA, US Vipul Jain - Westborough MA, US Cong Liu - Shrewsbury MA, US Suzanne Coley - Mansfield MA, US
Assignee:
Rohm and Haas Electronic Materials LLC - Marlborough MA
International Classification:
G03F 7/004 C07D 251/34 C08G 73/08
US Classification:
4302701, 4302711, 430927, 528367, 528289
Abstract:
Cyanurate compositions are provided that are particularly useful as a reagent to form a resin component of a coating composition underlying an overcoated photoresist. Preferred isocyanurates compound comprise substitution of multiple cyanurate nitrogen ring atoms by at least two distinct carboxy and/or carboxy ester groups.
Acetal/Alicyclic Polymers And Photoresist Compositions
Timothy Adams - Sudbury MA, US Suzanne Coley - Mansfield MA, US
Assignee:
Shipley Company, L.L.C. - Marlborough MA
International Classification:
G03F007/038 G03C001/492 G03C001/76
US Classification:
430/270100, 430/326000
Abstract:
The invention includes polymers that contain an alicyclic group (cage group) and acetal group which can undergo a deblocking reaction in the presence of photogenerated acid. The invention also provides photoresists that contain such polymers, particularly for imaging at short wavelengths such as sub-300 nm and sub-200 nm.
Coating Compositions For Use With An Overcoated Photoresist
Suzanne Coley - Mansfield MA, US Peter Trefonas - Medway MA, US Patricia Fallon - Newton MA, US Gerald Wayton - Leicester MA, US
Assignee:
Rohm and Haas Electronic Materials, L.L.C. - Marlborough MA
International Classification:
G03F 7/00 G03F 7/004
US Classification:
430330000, 430009000, 430322000, 430270100
Abstract:
Compositions and methods are provided that can reduce reflection of exposing radiation from a substrate back into an overcoated photoresist layer and/or function as a planarizing or via-fill layer. Preferred coating composition and methods of the invention can provide enhanced resolution of a patterned overcoated photoresist layer and include use of low activation temperature thermal acid generators as well as multiple thermal treatments to process a layer of the underlying coating composition.
Coating Compositions For Use With An Overcoated Photoresist
Anthony Zampini - Westborough MA, US Gerald B. Wayton - Leicester MA, US Vipul Jain - Westborough MA, US Cong Liu - Shrewsbury MA, US Suzanne Coley - Mansfield MA, US
Assignee:
Rohm and Haas Electronic Materials LLC - Marlborough MA
International Classification:
G03F 7/004 C09D 177/00 G03F 7/20
US Classification:
4302711, 524607, 430322
Abstract:
Coating compositions for use with an overcoated photoresist are provided where the coating composition comprises a resin containing cyanurate groups and hydrophobic groups. The coating composition can enhance resolution of an overcoated photoresist relief image.
James W. Thackeray - Braintree MA, US Suzanne M. Coley - Mansfield MA, US James F. Cameron - Brookline MA, US Paul J. LaBeaume - Framingham MA, US Ahmad E. Madkour - Midland MI, US Vipul Jain - Westborough MA, US
International Classification:
G03F 7/20 C07C 309/06 G03F 7/027
US Classification:
4302851, 4302811, 430311, 562113
Abstract:
A photoacid generator compound has formula (I):wherein G has formula (II):In formula (II), X is S or I, each Ris commonly attached to X and is independently Calkyl; polycyclic or monocyclic Ccycloalkyl; polycyclic or monocyclic Caryl; or a combination comprising at least one of the foregoing groups. G has a molecular weight greater than 263.4 g/mol, or less than 263.4 g/mol. One or more Rgroups are further attached to an adjacent Rgroup, a is 2 or 3, wherein when X is I, a is 2, or when X is S, a is 2 or 3. Z in formula (I) comprises the anion of a sulfonic acid, a sulfonimide, or a sulfonamide. A photoresist and coated film also includes the photoacid generator, and a method of forming an electronic device uses the photoresist.
James W. Thackeray - Braintree MA, US Suzanne M. Coley - Mansfield MA, US Vipul Jain - Westborough MA, US James F. Cameron - Brookline MA, US Paul J. LaBeaume - Framingham MA, US Ahmad E. Madkour - Midland MI, US
A compound has formula (I):wherein Q is a halogenated or non-halogenated, Colefin-containing group, A is a fluorine-substituted Calkylene group, a fluorine-substituted Ccycloalkylene group, a fluorine-substituted Carylene group, or a fluorine-substituted Calkylene-arylene group, Z is an anionic group comprising sulfonate, sulfonamide, or sulfonamide, and G has formula (II):wherein X is S or I, each Ris halogenated or non-halogenated and is independently Calkyl group; a polycyclic or monocyclic Ccycloalkyl group; a polycyclic or monocyclic Caryl group; or a combination of these, wherein when X is S, one of the Rgroups is optionally attached to one adjacent Rgroup by a single bond, and a is 2 or 3, wherein when X is I, a is 2, or when X is S, a is 3. A copolymer, a photoresist, a coated substrate and method of patterning are disclosed.
Susan Coley (1976-1980), janet hamby (1989-1993), Clinton murphy (1990-1994), mark bozko (2001-2005), James Leedle (1940-1942), Chris Hogsett (1983-1987)