Triad Semiconductor
Characterization Manager
Rfmd Feb 2006 - Oct 2013
Staff Product Characterization Engineer
Texas Instruments Dec 2003 - Jan 2006
Senior Product Engineer
Arques Technology Jun 2002 - Dec 2003
Staff Product Engineer
Semtech Sep 1999 - Jun 2002
Staff Product Engineer
Education:
Guilford College 1996 - 2000
Skills:
Mixed Signal Cmos Semiconductors Ic Analog Semiconductor Industry Test Engineering Electronics Circuit Design Soc Radio Frequency Product Engineering Asic Yield Integrated Circuits Analog Circuit Design System on A Chip Power Management
Roy V. Buck - Oak Ridge NC David N. Tesh - Randleman NC
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G01R 1512
US Classification:
324761
Abstract:
A test socket for a surface mount IC chip includes an array of double-ended spring contacts that extend out from opposite sides of a substrate, with a positioning frame on top of the substrate for aligning a chip and its leads with the upper contact heads. The spring contacts preferably have hollow elongate bodies with contact heads extending out from opposite sides under an internal spring bias. The socket can be formed from two laminates which have a series of aligned openings for the spring contacts, with expanded midsections on the spring contacts press-fit into the laminate openings and thereby securing holding the laminates together. A standoff on the upper socket surface vertically positions the IC chip, and provides the proper contact pressure between its leads and the spring contacts. The test socket can be removably mounted to a PC test board, with a releasable clamping device such as an air cylinder used to hold a chip to be tested in place within the socket.
David W. Tesh - Greensboro NC David D. Wesner - Greensboro NC
Assignee:
Amkor Industries, Inc. - Greensboro NC
International Classification:
F16C 1920
US Classification:
384549
Abstract:
A spinning frame roller comprising a core body on an outer peripheral surface of which is provided a circumferentially continuous, radially reentrant dovetail channel, with a correspondingly configured peripheral annular ring having a radially inwardly extending dovetail protrusion on its inner face matably engaging the dovetail channel and outer peripheral surface. The peripheral annular ring has an aspect ratio (radial thickness/axial thickness) of from about 0. 25 to about 0. 65, and is formed of a material having a durometer value of from about 55 to about 90. The roller in use is mounted on a shaft in a spinning frame for textile processing applications, and achieves extended wear and reduced tendency to "throwing" of the peripheral annular ring, relative to prior art rollers characterized by low durometer, high aspect ratio peripheral annular rings.
David Tesh (1973-1977), Ginger Cheatham (1980-1984), BIll Wilson (1971-1973), Lynn Thomas (1973-1977), Wendell Smith (1972-1976), Kathleen McKee (1983-1987)