Lothar F Bieg

US Patent:

6409413, Jun 25, 2002

Filed:

Jun 18, 1999

Appl. No.:

09/336182

Inventors:

Lothar F. Bieg - Albuquerque NM
Gilbert L. Benavides - Albuquerque NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

F16C 1106

US Classification:

403115, 403114, 403122

Abstract:

A new class of spherical joints has a very large accessible full cone angle, a property which is beneficial for a wide range of applications. Despite the large cone angles, these joints move freely without singularities.

US Patent:

6463664, Oct 15, 2002

Filed:

Oct 19, 2000

Appl. No.:

09/692027

Inventors:

Lothar F. Bieg - Albuquerque NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

B43L 1300

US Classification:

33 1M, 33 325, 33503, 33 26

Abstract:

An apparatus for positioning an item that provides two-dimensional, independent orthogonal motion of a platform in a X-Y plane. A pair of master and slave disks engages opposite sides of the platform. Rotational drivers are connected to master disks so the disks rotate eccentrically about axes of rotation. Opposing slave disks are connected to master disks on opposite sides of the platform by a timing belt, or are electronically synchronized together using stepper motors, to effect coordinated motion. The coordinated eccentric motion of the pairs of master/slave disks compels smooth linear motion of the platform in the X-Y plane without backlash. The apparatus can be a planar mechanism implemented in a MEMS device.

US Patent:

6519860, Feb 18, 2003

Filed:

Oct 19, 2000

Appl. No.:

09/692024

Inventors:

Lothar F. Bieg - Albuquerque NM
Bernhard Jokiel, Jr. - Albuquerque NM
Mark T. Ensz - Albuquerque NM
Robert D. Watson - Tijeras NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

G01B 500

US Classification:

33503, 33 1 PT, 33502, 33556, 73 179, 700254

Abstract:

Disclosed is a system and method for independently evaluating the spatial positional performance of a machine having a movable member, comprising an articulated coordinate measuring machine comprising: a first revolute joint; a probe arm, having a proximal end rigidly attached to the first joint, and having a distal end with a probe tip attached thereto, wherein the probe tip is pivotally mounted to the movable machine member; a second revolute joint; a first support arm serially connecting the first joint to the second joint; and coordinate processing means, operatively connected to the first and second revolute joints, for calculating the spatial coordinates of the probe tip; means for kinematically constraining the articulated coordinate measuring machine to a working surface; and comparator means, in operative association with the coordinate processing means and with the movable machine, for comparing the true position of the movable machine member, as measured by the true position of the probe tip, with the desired position of the movable machine member.

US Patent:

6640452, Nov 4, 2003

Filed:

Aug 20, 2002

Appl. No.:

10/225111

Inventors:

Lothar F. Bieg - Albuquerque NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

B43L 1300

US Classification:

33 1M, 33 325, 33503, 33 26

Abstract:

A bi-directional slide mechanism. A pair of master and slave disks engages opposite sides of the platform. Rotational drivers are connected to master disks so the disks rotate eccentrically about their respective axes of rotation. Opposing slave disks are connected to master disks on opposite sides of the platform by a circuitous mechanical linkage, or are electronically synchronized together using stepper motors, to effect coordinated motion. The synchronized eccentric motion of the pairs of master/slave disks compels smooth linear motion of the platform forwards and backwards without backlash. The apparatus can be incorporated in a MEMS device.

US Patent:

6668466, Dec 30, 2003

Filed:

Oct 19, 2000

Appl. No.:

09/692028

Inventors:

Lothar F. Bieg - Albuquerque NM
Bernhard Jokiel, Jr. - Albuquerque NM
Mark T. Ensz - Albuquerque NM
Robert D. Watson - Tijeras NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

G01B 500

US Classification:

33503, 33 1 PT, 33556, 33559

Abstract:

Disclosed is a highly accurate articulated coordinate measuring machine, comprising a revolute joint, comprising a circular encoder wheel, having an axis of rotation; a plurality of marks disposed around at least a portion of the circumference of the encoder wheel; bearing means for supporting the encoder wheel, while permitting free rotation of the encoder wheel about the wheels axis of rotation; and a sensor, rigidly attached to the bearing means, for detecting the motion of at least some of the marks as the encoder wheel rotates; a probe arm, having a proximal end rigidly attached to the encoder wheel, and having a distal end with a probe tip attached thereto; and coordinate processing means, operatively connected to the sensor, for converting the output of the sensor into a set of cylindrical coordinates representing the position of the probe tip relative to a reference cylindrical coordinate system.

US Patent:

6675671, Jan 13, 2004

Filed:

May 22, 2002

Appl. No.:

10/153109

Inventors:

Bernhard Jokiel, Jr. - Albuquerque NM
Gilbert L. Benavides - Albuquerque NM
Lothar F. Bieg - Albuquerque NM
James J. Allen - Albuquerque NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

B25J 700

US Classification:

7449009, 901 29

Abstract:

A multiple degree of freedom platform assembly formed from a plurality of thin films on a substrate can, when activated, move out of the plane of the substrate without additional manufacturing steps. The platform is connected to the substrate by at least three linkages, each linkage being pivotally connected to the platform and the base. At least two of the base connections are to powered traveling devices that are manufactured at one end of a path and which may be moved to locations along the path to cause the platform to move to predetermined positions. The entire assembly, including hinges, is manufactured as planar structures; preferably by a thin film technology such as MEMS.

US Patent:

20120063057, Mar 15, 2012

Filed:

Sep 9, 2010

Appl. No.:

12/878330

Inventors:

Thor E. Eilertsen - Oneonta NY, US
Chad Hall - Walton NY, US
Lothar Franz Bieg - Albuquerque NM, US

International Classification:

H01G 9/12

US Classification:

361502

Abstract:

In some embodiments, an apparatus includes a housing and a purge valve. The housing defines a cavity and a lumen extending from a volume of the cavity to a volume outside the cavity. The purge valve is disposed within the lumen and includes an occlusion member. A portion of the occlusion member has a width substantially equal to a width of an end portion of the lumen such that the portion of the occlusion member is disposed within the end portion of the lumen when the purge valve is in a first configuration. The portion of the occlusion member being disposed outside the end portion of the lumen when the purge valve is in a second configuration.

US Patent:

49777777, Dec 18, 1990

Filed:

Feb 9, 1989

Appl. No.:

7/308074

Inventors:

Lothar F. Bieg - Louisville CO

Assignee:

The United States of America as Represented by the United States
Department of Energy - Washington DC

International Classification:

G01B 1316

US Classification:

73 375

Abstract:

A fluid probe for measuring the surface contour of a machined part is provided whereby the machined part can remain on the machining apparatus during surface contour measurement. A measuring nozzle in a measuring probe directs a measuring fluid flow onto the surface. The measuring nozzle is on the probe situated midway between two guide nozzles that direct guide fluid flows onto the surface. When the guide fluid flows interact with the surface, they cause the measuring flow and measuring probe to be oriented perpendicular to the surface. The measuring probe includes a pressure chamber whose pressure is monitored. As the measuring fluid flow encounters changes in surface contour, pressure changes occur in the pressure chamber. The surface contour is represented as data corresponding to pressure changes in the pressure chamber as the surface is scanned.